Francisco André Corrêa Alegria
Francisco André Corrêa Alegria
Professor of Electrotechnical and Computer Engineering, Instituto Superior Técnico, Technical
Verified email at lx.it.pt
Title
Cited by
Cited by
Year
Automatic calibration of analog and digital measuring instruments using computer vision
E Corra Alegria, A Cruz Serra
Instrumentation and Measurement, IEEE Transactions on 49 (1), 94-99, 2000
1412000
Cross-correlation and sine-fitting techniques for high-resolution ultrasonic ranging
R Queiros, FC Alegria, PS Girao, ACC Serra
IEEE Transactions on Instrumentation and Measurement 59 (12), 3227-3236, 2010
1022010
Bias of amplitude estimation using three-parameter sine fitting in the presence of additive noise
FC Alegria
Measurement 42 (5), 748-756, 2009
612009
Using the skin effect to estimate cracks depths in mettalic structures
HMG Ramos, O Postolache, FC Alegria, AL Ribeiro
2009 IEEE instrumentation and measurement technology conference, 1361-1366, 2009
542009
Performance analysis of an ADC histogram test using small triangular waves
F Alegria, P Arpaia, AM da Cruz Serra, P Daponte
IEEE Transactions on Instrumentation and Measurement 51 (4), 723-729, 2002
542002
Computer vision applied to the automatic calibration of measuring instruments
FC Alegria, AC Serra
Measurement 28 (3), 185-195, 2000
512000
An ADC histogram test based on small-amplitude waves
FC Alegria, P Arpaia, P Daponte, AC Serra
Measurement 31 (4), 271-279, 2002
502002
Liftoff correction based on the spatial spectral behavior of eddy-current images
AL Ribeiro, F Alegria, OA Postolache, HMG Ramos
IEEE Transactions on Instrumentation and Measurement 59 (5), 1362-1367, 2010
372010
ADC histogram test by triangular small-waves
F Alegria, P Arpaia, AM da Cruz Serra, P Daponte
IMTC 2001. Proceedings of the 18th IEEE Instrumentation and Measurement …, 2001
372001
Measuring soil contamination with the time domain induced polarization method using LabVIEW
FC Alegria, E Martinho, F Almeida
Measurement 42 (7), 1082-1091, 2009
262009
Error in the estimation of transition voltages with the standard histogram test of ADCs
FC Alegria, AC Serra
Measurement 35 (4), 389-397, 2004
262004
Standard histogram test precision of ADC gain and offset error estimation
FC Alegria, AC Serra
IEEE Transactions on Instrumentation and Measurement 56 (5), 1527-1531, 2007
232007
3D-resistivity imaging and distribution of water soluble salts in Portuguese Renaissance stone bas-reliefs
E Martinho, F Alegria, A Dionisio, C Grangeia, F Almeida
Engineering Geology 141, 33-44, 2012
212012
GMR based eddy current sensing probe for weld zone testing
O Postolache, HG Ramos, AL Ribeiro, FC Alegria
SENSORS, 2009 IEEE, 73-78, 2009
202009
ADC histogram test using small amplitude input waves
FC Alegria, P Arpaia, P Daponte, AC Serra
na, 2000
202000
IEEE 1057 jitter test of waveform recorders
S Shariat-Panahi, FAC Alegria, A Mànuel, AM da Cruz Serra
IEEE Transactions on Instrumentation and Measurement 58 (7), 2234-2244, 2009
192009
Gaussian jitter-induced bias of sine wave amplitude estimation using three-parameter sine fitting
FC Alegria, AC Serra
IEEE Transactions on Instrumentation and Measurement 59 (9), 2328-2333, 2009
182009
Vehicle plate recognition for wireless traffic control and law enforcement system
F Alegria, PS Girao
2006 IEEE International Conference on Industrial Technology, 1800-1804, 2006
182006
Performance of data acquisition systems from the user's point of view
F Alegria, P Girão, V Haasz, A Serra
IEEE Transactions on Instrumentation and Measurement 53 (4), 907-914, 2004
182004
Analog-to-digital converter testing—new proposals
AC Serra, F Alegria, R Martins, MF da Silva
Computer Standards & Interfaces 26 (1), 3-13, 2004
182004
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