Следене
Khaled  Ahmeda
Khaled Ahmeda
Dynex Semiconductor Ltd
Потвърден имейл адрес: dynexsemi.com
Заглавие
Позовавания
Позовавания
Година
Role of self-heating and polarization in AlGaN/GaN-based heterostructures
K Ahmeda, B Ubochi, B Benbakhti, SJ Duffy, A Soltani, WD Zhang, ...
IEEE Access 5, 20946-20952, 2017
212017
Operational frequency degradation induced trapping in scaled GaN HEMTs
B Ubochi, S Faramehr, K Ahmeda, P Igić, K Kalna
Microelectronics Reliability 71, 35-40, 2017
132017
A parametric technique for trap characterization in AlGaN/GaN HEMTs
SJ Duffy, B Benbakhti, W Zhang, K Ahmeda, K Kalna, M Boucherta, ...
IEEE Transactions on Electron Devices 67 (5), 1924-1930, 2020
102020
Buffer trap related knee walkout and the effects of self-heating in AlGaN/GaN HEMTs
B Ubochi, K Ahmeda, K Kalna
ECS Journal of Solid State Science and Technology 6 (11), S3005, 2017
92017
The role of SiN/GaN cap interface charge and GaN cap layer to achieve enhancement mode GaN MIS-HEMT operation
K Ahmeda, B Ubochi, MH Alqaysi, A Al-Khalidi, E Wasige, K Kalna
Microelectronics Reliability 115, 113965, 2020
82020
Impact of interface traps/defects and self‐heating on the degradation of performance of a 4H‐SiC VDMOSFET
MH Alqaysi, A Martinez, K Ahmeda, B Ubochi, K Kalna
IET Power Electronics 12 (11), 2731-2740, 2019
82019
Self-heating and polarization effects in AlGaN/AlN/GaN/AlGaN based devices
K Ahmeda, B Ubochi, K Kalna, B Benbakhti, SJ Duffy, W Zhang, A Soltani
2017 12th European Microwave Integrated Circuits Conference (EuMIC), 37-40, 2017
42017
Acoustical characteristics of proton exchange membrane fuel cells
M Al-Rweg, K Ahmeda, A Albarbar
IEEE Access 9, 81068-81077, 2021
12021
A source and drain transient currents technique for trap characterisation in AIGaN/GaN HEMTs
SJ Duffy, B Benbakhti, W Zhang, K Kalna, K Ahmeda, M Boucherta, ...
2018 13th European Microwave Integrated Circuits Conference (EuMIC), 214-217, 2018
12018
Scaling and traps induced degradation of cutoff frequency in GaN HEMT
BC Ubochi, S Faramehr, K Ahmeda, P Igić, K Kalna
2016 11th International Conference on Advanced Semiconductor Devices …, 2016
12016
Analytical Modeling of Depletion-Mode MOSHEMT Device for High-Temperature Applications
N Islam, MFP Mohamed, N Ahmad, MM Isa, AF Abd Rahim, K Ahmeda
IEEE Access, 2024
2024
Analysis Of The Reliability Of Passivation Layer And Interface Charge On Breakdown Voltage of E-Mode AlGaN/GaN MISHEMTs Device
N Islam, MFP Mohamed, FAJ Khan, S Falina, H Kawarada, M Syamsul, ...
2023 IEEE International Symposium on the Physical and Failure Analysis of …, 2023
2023
Influence of temperature and dimension in a 4H-SiC vertical power MOSFET
MH Alqaysi, A Martinez, B Ubochi, S Batcup, K Ahmeda
Engineering Research Express 2 (4), 045020, 2020
2020
Self-heating and Reliability of GaN HEMTs for Energy Management
K Ahmeda
Swansea University, 2018
2018
Buffer trapping effects on knee walkout in GaN HEMTs
B Ubochi, K Ahmeda, K Kalna
2017 IEEE International Conference on Microwaves, Antennas, Communications …, 2017
2017
A Source and Drain Transient Currents Technique for Trap Characterisation in AlGaN/GaN Based Devices
S Duffy, B Benbakhti, W Zhang, K Kalna, K Ahmeda, H Maher, A Soltani
47th European Solid-State Device Research Conference (ESSDERC), 2017
2017
The effect of self-heating and electrical stress induced polarization in AlGaN/GaN heterojunction based devices
K Ahmeda, S Faramehr, P Igić, K Kalna, SJ Duffy, A Soltani, B Benbakhti
2016 11th International Conference on Advanced Semiconductor Devices …, 2016
2016
ASDAM 2016, The 11th International Conference on Advanced Semiconductor Devices And Microsystems, November 13-16, 2016, Smolenice, Slovakia
R Adam, K Ahmeda, H Al-Nashash, R Andok, J Arbet, O Babchenko, ...
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