Следене
Suseendran Jayachandran
Suseendran Jayachandran
Lightelligence
Потвърден имейл адрес: lightelligence.ai
Заглавие
Позовавания
Позовавания
Година
Stacking of multilayer InAs quantum dots with combination capping of InAlGaAs and high temperature grown GaAs
J Suseendran, N Halder, S Chakrabarti, TD Mishima, CR Stanley
Superlattices and Microstructures 46 (6), 900-906, 2009
312009
Deposition of O atomic layers on Si (100) substrates for epitaxial Si-O superlattices: investigation of the surface chemistry
S Jayachandran, A Delabie, A Billen, H Dekkers, B Douhard, T Conard, ...
Applied Surface Science 324, 251-257, 2015
142015
Chemical vapor deposition processes for the fabrication of epitaxial Si-O superlattices
S Jayachandran, A Delabie, J Maggen, M Caymax, R Loo, J Meersschaut, ...
Thin Solid Films 557, 36-41, 2013
122013
Epitaxial chemical vapor deposition of silicon on an oxygen monolayer on Si (100) substrates
A Delabie, S Jayachandran, M Caymax, R Loo, J Maggen, G Pourtois, ...
ECS Solid State Letters 2 (11), P104, 2013
112013
Low loss high refractive index niobium oxide waveguide platform for visible light applications
K Lodewijks, S Jayachandran, TD Kongnyuy, S Lenci, S Das, ...
Integrated Photonics Research, Silicon and Nanophotonics, ITh2B. 3, 2018
92018
Growth mechanisms for Si epitaxy on O atomic layers: Impact of O-content and surface structure
S Jayachandran, A Billen, B Douhard, T Conard, J Meersschaut, ...
Applied Surface Science 384, 152-160, 2016
72016
Deep levels in silicon–oxygen superlattices
E Simoen, S Jayachandran, A Delabie, M Caymax, M Heyns
Semiconductor Science and Technology 31 (2), 025015, 2015
72015
Valence Band Profile in Two-Dimensional Silicon-Oxygen Superlattices Probed by Internal Photoemission
NM Kolomiiets, VV Afanas' ev, S Jayachandran, A Delabie, M Heyns, ...
ECS Journal of Solid State Science and Technology 5 (11), Q3008, 2016
52016
Effect of InAlGaAs and GaAs combination barrier thickness on the duration of dot formation in different layers of stacked InAs/GaAs quantum dot heterostructure grown by MBE
N Halder, J Suseendran, S Chakrabarti, M Herrera, M Bonds, ...
Journal of Nanoscience and Nanotechnology 10 (8), 5202-5206, 2010
52010
Effect of InAlGaAs and GaAs combination barrier thickness on the stacking of InAs/GaAs quantum dot heterostructure grown by MBE
J Suseendran, N Halder, S Chakrabarti, TD Mishima
IOP Conference Series: Materials Science and Engineering 6 (1), 012006, 2009
52009
Quasi Two-Dimensional Si-O Superlattices: Atomically Controlled Growth and Electrical Properties
S Jayachandran, E Simoen, K Martens, J Meersschaut, H Bender, ...
ECS Journal of Solid State Science and Technology 5 (7), P396, 2016
42016
Nb2O5 as waveguide material for visible light photonic integrated circuits (Conference Presentation)
S Jayachandran, S Lenci, K Lodewijks, TD Kongnyuy, K Leyssens, ...
Nanophotonic Materials XV 10720, 1072009, 2018
12018
A deep‐level transient spectroscopy study of p‐type silicon Schottky barriers containing a Si–O superlattice
E Simoen, S Jayachandran, A Delabie, M Caymax, M Heyns
physica status solidi (b) 254 (4), 1600593, 2017
12017
Comparison between Si/SiO2 mid‐gap interface states and deep levels associated with silicon‐oxygen superlattices in p‐type silicon
E Simoen, S Jayachandran, A Delabie, M Caymax, M Heyns
physica status solidi (c) 13 (10‐12), 718-723, 2016
12016
Study of Electron Traps Associated With Oxygen Superlattices in n‐Type Silicon
E Simoen, S Jayachandran, A Delabie, M Caymax, M Heyns
physica status solidi c 14 (12), 1700136, 2017
2017
A deep-level transient spectroscopy study of silicon Schottky barriers containing a Si-O superlattice
E Simoen, S Jayachandran, A Delabie, M Caymax, M Heyns
2017
Quasi 2D Si-O Superlattices for Future Nanoelectronic Applications
S Jayachandran
2016
Study of electrically active defects in epitaxial layers on silicon
E Simoen, SK Dhayalan, S Jayachandran, S Gupta, F Gencarelli, ...
2016 China Semiconductor Technology International Conference (CSTIC), 1-3, 2016
2016
Quasi 2D epitaxial Si-O superlattices: growth, device performance and defect analysis
S Jayachandran, K Martens, E Simoen, M Caymax, W Vandervorst, ...
2016
Heterostructures by inserting oxygen monolayers in Si: 2D nanolattice growth, electronic properties and MOSFET device characteristics
S Jayachandran, K Martens, A Lu, K Nishio, G Pourtois, A Delabie, ...
Bulletin of the American Physical Society 60, 2015
2015
Системата не може да изпълни операцията сега. Опитайте отново по-късно.
Статии 1–20