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Carlos D. Castillo
Carlos D. Castillo
Principal Applied Scientist at Amazon
Verified email at amazon.com
Title
Cited by
Cited by
Year
Frontal to Profile Face Verification in the Wild
S Sengupta, JC Chen, CD Castillo, VM Patel, R Chellappa, DW Jacobs
IEEE Winter conference on Applications of Computer Vision (WACV), 2016
9002016
Generate to adapt: Aligning domains using generative adversarial networks
S Sankaranarayanan, Y Balaji, CD Castillo, R Chellappa
Proceedings of the IEEE conference on computer vision and pattern …, 2018
8172018
L2-constrained softmax loss for discriminative face verification
R Ranjan, CD Castillo, R Chellappa
arXiv preprint arXiv:1703.09507, 2017
6012017
An all-in-one convolutional neural network for face analysis
R Ranjan, S Sankaranarayanan, CD Castillo, R Chellappa
2017 12th IEEE international conference on automatic face & gesture …, 2017
5242017
Face recognition accuracy of forensic examiners, superrecognizers, and face recognition algorithms
PJ Phillips, AN Yates, Y Hu, CA Hahn, E Noyes, K Jackson, JG Cavazos, ...
Proceedings of the National Academy of Sciences 115 (24), 6171-6176, 2018
4222018
SfSNet: Learning Shape, Reflectance and Illuminance of Faces in the Wild
S Sengupta, A Kanazawa, CD Castillo, DW Jacobs
Proceedings of the IEEE Conference on Computer Vision and Pattern …, 2018
3662018
Umdfaces: An annotated face dataset for training deep networks
A Bansal, A Nanduri, CD Castillo, R Ranjan, R Chellappa
2017 IEEE international joint conference on biometrics (IJCB), 464-473, 2017
2852017
Triplet probabilistic embedding for face verification and clustering
S Sankaranarayanan, A Alavi, CD Castillo, R Chellappa
2016 IEEE 8th international conference on biometrics theory, applications …, 2016
2742016
Deep learning for understanding faces: Machines may be just as good, or better, than humans
R Ranjan, S Sankaranarayanan, A Bansal, N Bodla, JC Chen, VM Patel, ...
IEEE Signal Processing Magazine 35 (1), 66-83, 2018
2492018
Accuracy comparison across face recognition algorithms: Where are we on measuring race bias?
JG Cavazos, PJ Phillips, CD Castillo, AJ O’Toole
IEEE transactions on biometrics, behavior, and identity science 3 (1), 101-111, 2020
2362020
A fast and accurate system for face detection, identification, and verification
R Ranjan, A Bansal, J Zheng, H Xu, J Gleason, B Lu, A Nanduri, JC Chen, ...
IEEE Transactions on Biometrics, Behavior, and Identity Science 1 (2), 82-96, 2019
2192019
Face space representations in deep convolutional neural networks
AJ O’Toole, CD Castillo, CJ Parde, MQ Hill, R Chellappa
Trends in cognitive sciences 22 (9), 794-809, 2018
1582018
The do's and don'ts for cnn-based face verification
A Bansal, C Castillo, R Ranjan, R Chellappa
Proceedings of the IEEE international conference on computer vision …, 2017
1292017
An End-to-End System for Unconstrained Face Verification with Deep Convolutional Neural Networks
JC Chen, R Ranjan, S Sankaranarayanan, A Kumar, CH Chen, VM Patel, ...
arXiv preprint:1605.02686, 2016
1242016
Low-rank transfer subspace learning
M Shao, C Castillo, Z Gu, Y Fu
2012 IEEE 12th International Conference on Data Mining, 1104-1109, 2012
842012
An experimental evaluation of covariates effects on unconstrained face verification
B Lu, JC Chen, CD Castillo, R Chellappa
IEEE Transactions on Biometrics, Behavior, and Identity Science 1 (1), 42-55, 2019
822019
Crystal loss and quality pooling for unconstrained face verification and recognition
R Ranjan, A Bansal, H Xu, S Sankaranarayanan, JC Chen, CD Castillo, ...
arXiv preprint arXiv:1804.01159, 2018
812018
An automatic system for unconstrained video-based face recognition
J Zheng, R Ranjan, CH Chen, JC Chen, CD Castillo, R Chellappa
IEEE Transactions on Biometrics, Behavior, and Identity Science 2 (3), 194-209, 2020
782020
Deep density clustering of unconstrained faces
WA Lin, JC Chen, CD Castillo, R Chellappa
Proceedings of the IEEE conference on computer vision and pattern …, 2018
782018
Using stereo matching with general epipolar geometry for 2d face recognition across pose
CD Castillo, DW Jacobs
IEEE Transactions on Pattern Analysis and Machine Intelligence 31 (12), 2298 …, 2009
782009
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Articles 1–20