| CEL-Seq2: sensitive highly-multiplexed single-cell RNA-Seq T Hashimshony, N Senderovich, G Avital, A Klochendler, Y de Leeuw, ... Genome biology 17 (1), 77, 2016 | 1083 | 2016 |
| Accuracy in optical overlay metrology B Bringoltz, T Marciano, T Yaziv, Y DeLeeuw, D Klein, Y Feler, I Adam, ... Metrology, Inspection, and Process Control for Microlithography XXX 9778, 97781H, 2016 | 36 | 2016 |
| Accuracy improvements in optical metrology B Bringoltz, E Gurevich, I Adam, Y Feler, D Alumot, Y Lamhot, N Sella, ... US Patent App. 15/540,409, 2018 | 6 | 2018 |
| Diffusion in sparse networks: Linear to semilinear crossover Y de Leeuw, D Cohen Physical Review E 86 (5), 051120, 2012 | 4 | 2012 |
| Resistor-network anomalies in the heat transport of random harmonic chains I Weinberg, Y de Leeuw, T Kottos, D Cohen Physical Review E 93 (6), 062138, 2016 | 1 | 2016 |
| CEL-Seq-pipeline: CEL-Seq2 pipeline version 1.0 M Feder, Y de Leeuw, L Anavy | | 2015 |
| Accuracy In Optical Overlay Metrology The physics by which process variations determine accuracy and robustness of overlay metrology. January 18th, 2017-By: KLA-Tencor B Bringoltz, T Marciano, T Yaziv, Y DeLeeuw, D Klein, Y Feler, I Adam, ... | | |
