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Ah-Young Park
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Year
Prediction of deformation during manufacturing processes of silicon interposer package with TSVs
Y Kim, AY Park, CL Kao, M Su, B Black, S Park
Microelectronics Reliability 65, 234-242, 2016
312016
TSV and Cu-Cu direct bond wafer and package-level reliability
K Hummler, B Sapp, JR Lloyd, S Kruger, S Olson, SB Park, B Murray, ...
Electronic Components and Technology Conference (ECTC), 2013 IEEE 63rd, 41-48, 2013
192013
Modification of pinch instability theory for analysis of spray mode in GMAW
AY Park, SR Kim, MA Hammad, CD Yoo
Journal of Physics D: Applied Physics 42 (22), 225503, 2009
122009
Thermo-mechanical simulations of a copper-to-copper direct bonded 3D TSV chip package interaction test vehicle
AY Park, D Ferrone, S Cain, DY Jung, BT Murray, S Park, K Hummler
2013 IEEE 63rd Electronic Components and Technology Conference, 2228-2234, 2013
92013
Evaluation of crack propagation at the interconnection interface induced by warpage of fan-out wafer-level-package
AY Park, JH Lee, JY Song, SM Kim, S Han
2019 IEEE 21st Electronics Packaging Technology Conference (EPTC), 99-102, 2019
52019
A Fracture mechanics based parametric study of the copper-to-copper direct thermo-compression bonded interface using finite element method
AY Park, S Chaparala, S Park
International Electronic Packaging Technical Conference and Exhibition 55751 …, 2013
42013
Risk assessment of the crack propagation and delamination of the Cu-to-Cu direct bonded (CuDB) interface
AY Park, SC Chaparala, SB Park
Microelectronics Reliability 66, 113-121, 2016
32016
A fracture mechanics based parametric study with dimensional variables of the Cu-Cu direct thermo-Compression bonded interface using FEA
AY Park, SC Chaparala, SB Park
2015 IEEE 65th Electronic Components and Technology Conference (ECTC), 1926-1931, 2015
32015
Development of inclined conductive bump for flip-chip interconnection
AY Park, S Park, CD Yoo
IEEE Transactions on Components, Packaging and Manufacturing Technology 5 (2 …, 2014
32014
Low height wire bond looping technology using wedge bonding for the MMIC package
AY Park, JH Lee, S Kim, S Kang, S Han, SI Kim, JY Song
2022 IEEE 9th Electronics System-Integration Technology Conference (ESTC …, 2022
12022
An efficient edge traces technique for 3D interconnection of stack chip
SR Kim, AY Park, CD Yoo, JH Lee, JY Song, SS Lee
2011 IEEE 61st Electronic Components and Technology Conference (ECTC), 1878-1882, 2011
12011
Development of inclined conductive bump (ICB) for flip-chip interconnection
AY Park, SR Kim, CD Yoo, TS Kim
2011 IEEE 61st Electronic Components and Technology Conference (ECTC), 880-885, 2011
12011
Optimization of process parameters in micro-scale pneumatic aerosol jet printing for high-yield precise electrodes
H Jeong, JH Lee, S Kim, S Han, H Moon, JY Song, AY Park
Scientific Reports 13 (1), 21297, 2023
2023
Machine Learning‐Based Solution for Thermomechanical Analysis of MMIC Packaging
S Kang, JH Lee, SM Kim, J Lim, AY Park, S Han, JY Song, SI Kim
Advanced Materials Technologies 8 (5), 2201479, 2023
2023
Hybrid Solder with silver hierarchical structure and particle for Synergistic effect in shear strength of die attach behaviour
H Jeong, JH Lee, SM Kim, AY Park, JY Song
2022 IEEE 24th Electronics Packaging Technology Conference (EPTC), 509-512, 2022
2022
Thermo-mechanical problems and their solution in a 3D micro-electronics package using Cu-to-Cu direct bonding
AY Park
State University of New York at Binghamton, 2017
2017
Design Guideline to Improve Thermal Management of 3D Package Using Cu-to-Cu Direct Bonding
AY Park, SB Park
International Electronic Packaging Technical Conference and Exhibition 56888 …, 2015
2015
Development of Inclined Conductive Bump for Electronic Packaging
AY Park, SR Kim, CD Yoo, T Kim
Proceedings of the Korean Society of Precision Engineering Conference, 731-732, 2011
2011
Design of Spool and Bar Horns for Ultrasonic Bonding
SR Kim, JH Lee, AY Park, CD Yoo
Elsevier Science Bv, 2010
2010
Analysis of Spray Mode Using Modified Pinch Instability Theory
AY Park, MA Hammad, SR Kim, CD Yoo
Journal of Welding and Joining 27 (5), 88-93, 2009
2009
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Articles 1–20