| Stereo-digital image correlation (DIC) measurements with a single camera using a biprism K Genovese, L Casaletto, JA Rayas, V Flores, A Martinez Optics and Lasers in Engineering 51 (3), 278-285, 2013 | 131 | 2013 |
| Self-healing property of a caustic optical beam M Anguiano-Morales, A Martínez, MD Iturbe-Castillo, S Chávez-Cerda, ... Applied optics 46 (34), 8284-8290, 2007 | 93 | 2007 |
| Three-dimensional deformation measurement from the combination of in-plane and out-of-plane electronic speckle pattern interferometers A Martínez, JA Rayas, R Rodríguez-Vera, HJ Puga Applied optics 43 (24), 4652-4658, 2004 | 69 | 2004 |
| Correction masks for thickness uniformity in large-area thin films F Villa, A Martinez, LE Regalado Applied optics 39 (10), 1602-1610, 2000 | 63 | 2000 |
| Uncertainty analysis of temporal phase-stepping algorithms for interferometry RR Cordero, J Molimard, A Martínez, F Labbe Optics Communications 275 (1), 144-155, 2007 | 49 | 2007 |
| Medición del módulo de Young en el hule látex usando ESPI JA Rayas, R Rodríguez-Vera, A Martínez Revista mexicana de física 49 (6), 555-564, 2003 | 46 | 2003 |
| The condensation of furfural with urea. A Martínez-García, M Ortiz, R Martínez, P Ortiz, E Reguera | 43 | 2004 |
| Different field distributions obtained with an axicon and an amplitude mask M Anguiano-Morales, A Martínez, MD Iturbe-Castillo, S Chávez-Cerda Optics Communications 281 (3), 401-407, 2008 | 42 | 2008 |
| 4D profile of phase objects through the use of a simultaneous phase shifting quasi-common path interferometer NI Toto-Arellano, DI Serrano-García, AM García, GR Zurita, ... Journal of Optics 13 (11), 115502, 2011 | 39 | 2011 |
| Iterative estimation of the topography measurement by fringe-projection method with divergent illumination by considering the pitch variation along the x and z directions A Martínez, JA Rayas, HJ Puga, K Genovese Optics and lasers in engineering 48 (9), 877-881, 2010 | 39 | 2010 |
| Slope measurement of a phase object using a polarizing phase-shifting high-frequency Ronchi grating interferometer NI Toto-Arellano, A Martínez-García, G Rodríguez-Zurita, ... Applied optics 49 (33), 6402-6408, 2010 | 37 | 2010 |
| Fracture detection by grating moiré and in-plane ESPI techniques A Martı́nez, R Rodrı́guez-Vera, JA Rayas, HJ Puga Optics and Lasers in Engineering 39 (5-6), 525-536, 2003 | 37 | 2003 |
| Measurement of mean thickness of transparent samples using simultaneous phase shifting interferometry with four interferograms VH Flores Muñoz, NIT Arellano, DI Serrano García, A Martínez García, ... Applied Optics 55 (15), 4047-4051, 2016 | 33 | 2016 |
| Low energy theorem and photodisintegration of light nuclei J Govaerts, JL Lucio, A Martinez, J Pestieau Nuclear Physics A 368 (3), 409-428, 1981 | 33 | 1981 |
| Coherent scattering by one-dimensional randomly rough metallic surfaces EI Chaikina, AG Navarrete, ER Méndez, A Martínez, AA Maradudin Applied optics 37 (6), 1110-1121, 1998 | 32 | 1998 |
| Parallel two-step phase shifting interferometry using a double cyclic shear interferometer NI Toto-Arellano, DI Serrano-García, A Martínez-García Optics express 21 (26), 31983-31989, 2013 | 30 | 2013 |
| General model to predict and correct errors in phase map interpretation and measurement for out-of-plane ESPI interferometers HJ Puga, R Rodrıguez-Vera, A Martınez Optics & Laser Technology 34 (1), 81-92, 2002 | 30 | 2002 |
| Measuring displacement derivatives by electronic speckle pattern shearing interferometry (ESPSI) F Labbe, RR Cordero, A Martínez, R Rodríguez-Vera Measurement Science and Technology 16 (8), 1677, 2005 | 28 | 2005 |
| Full-surface deformation measurement of anisotropic tissues under indentation K Genovese, A Montes, A Martinez, SL Evans Medical engineering & physics 37 (5), 484-493, 2015 | 27 | 2015 |
| Uncertainty evaluation of displacements measured by electronic speckle-pattern interferometry RR Cordero, A Martı́nez, R Rodrı́guez-Vera, P Roth Optics Communications 241 (4-6), 279-292, 2004 | 27 | 2004 |
Juan Antonio RayasCentro de Investigaciones en ÓpticaПотвърден имейл адрес: cio.mx
