Elhadj Dogheche
Elhadj Dogheche
Insitute Electronic Microelectronic Nanotechnology IEMN CNRS
Verified email at univ-valenciennes.fr - Homepage
Title
Cited by
Cited by
Year
Physical properties of RF sputtered ITO thin films and annealing effect
L Kerkache, A Layadi, E Dogheche, D Remiens
Journal of Physics D: Applied Physics 39 (1), 184, 2005
1662005
Laser Doppler vibrometry for evaluating the piezoelectric coefficient on thin film
R Herdier, D Jenkins, E Dogheche, D Rèmiens, M Sulc
Review of scientific instruments 77 (9), 093905, 2006
812006
Mechanical properties of diamond films: A comparative study of polycrystalline and smooth fine-grained diamonds by Brillouin light scattering
P Djemia, C Dugautier, T Chauveau, E Dogheche, MI De Barros, ...
Journal of Applied Physics 90 (8), 3771-3779, 2001
782001
thick films grown on sapphire by using a multistep sputtering process
X Lansiaux, E Dogheche, D Remiens, M Guilloux-Viry, A Perrin, ...
Journal of Applied Physics 90 (10), 5274-5277, 2001
602001
Optical waveguide loss minimized into gallium nitride based structures grown by metal organic vapor phase epitaxy
A Stolz, E Cho, E Dogheche, Y Androussi, D Troadec, D Pavlidis, ...
Applied Physics Letters 98 (16), 161903, 2011
462011
Growth and optical characterization of aluminum nitride thin films deposited on silicon by radio-frequency sputtering
E Dogheche, D Remiens, A Boudrioua, JC Loulergue
Applied physics letters 74 (9), 1209-1211, 1999
431999
Micro structuring of LiNbO3 by using nanosecond pulsed laser ablation
F Meriche, E Neiss-Clauss, R Kremer, A Boudrioua, E Dogheche, ...
Applied surface science 254 (4), 1327-1331, 2007
342007
Electro-optic characterization of thin films using prism-coupling technique
A Boudrioua, E Dogheche, D Remiens, JC Loulergue
Journal of applied physics 85 (3), 1780-1783, 1999
341999
Thick layers on diamond-coated silicon for surface acoustic wave filters
E Dogheche, V Sadaune, X Lansiaux, D Remiens, T Gryba
Applied physics letters 81 (7), 1329-1331, 2002
322002
High-frequency surface acoustic wave devices based on multilayered structure
E Dogheche, D Remiens, S Shikata, A Hachigo, H Nakahata
Applied physics letters 87 (21), 213503, 2005
292005
m-line spectroscopy for optical analysis of thick layers grown on sapphire substrates by radio-frequency multistep sputtering
E Dogheche, X Lansiaux, D Remiens
Journal of applied physics 93 (2), 1165-1168, 2003
292003
Ultra-low loss ridge waveguides on lithium niobate via argon ion milling and gas clustered ion beam smoothening
SY Siew, EJH Cheung, H Liang, A Bettiol, N Toyoda, B Alshehri, ...
Optics express 26 (4), 4421-4430, 2018
272018
Correlation between threading dislocation density and the refractive index of AlN grown by molecular-beam epitaxy on Si (111)
F Natali, F Semond, J Massies, D Byrne, S Laügt, O Tottereau, ...
Applied physics letters 82 (9), 1386-1388, 2003
272003
Optical waveguiding in epitaxial PbTiO 3 thin films
E Dogheche, B Jaber, D Rémiens
Applied optics 37 (19), 4245-4248, 1998
261998
Efficient reduction of Cr (VI) under visible light irradiation using CuS nanostructures
S Nezar, Y Cherifi, A Barras, A Addad, E Dogheche, N Saoula, NA Laoufi, ...
Arabian journal of chemistry 12 (2), 215-224, 2019
242019
Structural, ferroelectric and dielectric properties of In2O3: Sn (ITO) on PbZr0. 53Ti0. 47O3 (PZT)/Pt and annealing effect
L Kerkache, A Layadi, E Dogheche, D Remiens
Journal of Alloys and Compounds 509 (20), 6072-6076, 2011
232011
Interface properties of heterostructures from optical waveguiding information
E Dogheche, B Belgacem, D Remiens, P Ruterana, F Omnes
Applied physics letters 75 (21), 3324-3326, 1999
211999
Fabrication and investigation of 1D and 2D structures in LiNbO3 thin films by pulsed laser ablation
F Meriche, A Boudrioua, R Kremer, E Dogheche, E Neiss-Clauss, ...
Optical Materials 32 (11), 1427-1434, 2010
202010
The effect of LaNiO3 bottom electrode thickness on ferroelectric and dielectric properties of (1 0 0) oriented PbZr0. 53Ti0. 47O3 films
GS Wang, D Remiens, C Soyer, E Dogheche, E Cattan
Journal of crystal growth 284 (1-2), 184-189, 2005
202005
Effect of varying pore size of AAO films on refractive index and birefringence measured by prism coupling technique
SH Gong, A Stolz, GH Myeong, E Dogheche, A Gokarna, SW Ryu, ...
Optics letters 36 (21), 4272-4274, 2011
192011
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