Следене
Himanshu Madan
Himanshu Madan
Intel, PennState University
Потвърден имейл адрес: intel.com
Заглавие
Позовавания
Позовавания
Година
Fermi level unpinning of GaSb (100) using plasma enhanced atomic layer deposition of AlO
A Ali, HS Madan, AP Kirk, DA Zhao, DA Mourey, MK Hudait, RM Wallace, ...
Applied Physics Letters 97, 143502, 2010
1402010
Small-Signal Response of Inversion Layers in High-Mobility $ hbox {In} _ {0.53} hbox {Ga} _ {0.47} hbox {As} $ MOSFETs Made With Thin High-$ kappa $ Dielectrics
A Ali, H Madan, S Koveshnikov, S Oktyabrsky, R Kambhampati, T Heeg, ...
Electron Devices, IEEE Transactions on 57 (4), 742-748, 2010
942010
Demonstration of In 0.9 Ga 0.1 As/GaAs 0.18 Sb 0.82 near broken-gap tunnel FET with I ON= 740μA/μm, G M= 70μS/μm and gigahertz switching performance at V Ds= 0.5 V
R Bijesh, H Liu, H Madan, D Mohata, W Li, NV Nguyen, D Gundlach, ...
2013 IEEE International Electron Devices Meeting, 28.2. 1-28.2. 4, 2013
762013
Quantitative mapping of phase coexistence in Mott-Peierls insulator during electronic and thermally driven phase transition
H Madan, M Jerry, A Pogrebnyakov, T Mayer, S Datta
ACS nano 9 (2), 2009-2017, 2015
642015
26.5 Terahertz electrically triggered RF switch on epitaxial VO2-on-Sapphire (VOS) wafer
H Madan, HT Zhang, M Jerry, D Mukherjee, N Alem, R Engel-Herbert, ...
2015 IEEE International Electron Devices Meeting (IEDM), 9.3. 1-9.3. 4, 2015
522015
Demonstration of p-type In0.7Ga0.3As/GaAs0.35Sb0.65 and n-type GaAs0.4Sb0.6/In0.65Ga0.35As complimentary Heterojunction Vertical Tunnel FETs for …
R Pandey, H Madan, H Liu, V Chobpattana, M Barth, B Rajamohanan, ...
2015 Symposium on VLSI Technology (VLSI Technology), T206-T207, 2015
522015
Critical discussion on (100) and (110) orientation dependent transport: nMOS planar and FinFET
CD Young, MO Baykan, A Agrawal, H Madan, K Akarvardar, C Hobbs, ...
2011 Symposium on VLSI Technology-Digest of Technical Papers, 18-19, 2011
352011
Asymmetric tunnel field-effect transistors as frequency multipliers
H Madan, V Saripalli, H Liu, S Datta
IEEE electron device letters 33 (11), 1547-1549, 2012
302012
Record high conversion gain ambipolar graphene mixer at 10GHz using scaled gate oxide
H Madan, MJ Hollander, M LaBella, R Cavalero, D Snyder, JA Robinson, ...
2012 International Electron Devices Meeting, 4.3. 1-4.3. 4, 2012
292012
Advanced composite high-κ gate stack for mixed anion arsenide-antimonide quantum well transistors
A Ali, H Madan, R Misra, E Hwang, A Agrawal, I Ramirez, P Schiffer, ...
2010 International Electron Devices Meeting, 6.3. 1-6.3. 4, 2010
292010
Fermi level unpinning of GaSb(100) using Plasma Enhanced ALD Al2O3dielectric
A Ali, HS Madan, AP Kirk, RM Wallace, DA Zhao, DA Mourey, M Hudait, ...
68th Device Research Conference, 27-30, 2010
282010
Experimental determination of quantum and centroid capacitance in arsenide–antimonide quantum-well MOSFETs incorporating nonparabolicity effect
A Ali, H Madan, R Misra, A Agrawal, P Schiffer, JB Boos, BR Bennett, ...
IEEE transactions on electron devices 58 (5), 1397-1403, 2011
272011
Enhancement-mode antimonide quantum-well MOSFETs with high electron mobility and gigahertz small-signal switching performance
A Ali, H Madan, A Agrawal, I Ramirez, R Misra, JB Boos, BR Bennett, ...
IEEE electron device letters 32 (12), 1689-1691, 2011
252011
Effect of interface states on the performance of antimonide nMOSFETs
A Ali, H Madan, MJ Barth, JB Boos, BR Bennett, S Datta
IEEE electron device letters 34 (3), 360-362, 2013
152013
Performance and variability in multi-VTFinFETs using fin doping
K Akarvardar, CD Young, D Veksler, KW Ang, I Ok, M Rodgers, V Kaushik, ...
Proceedings of Technical Program of 2012 VLSI Technology, System and …, 2012
132012
Short-channel graphene nanoribbon transistors with enhanced symmetry between p-and n-branches
MJ Hollander, H Madan, N Shukla, DA Snyder, JA Robinson, S Datta
Applied Physics Express 7 (5), 055103, 2014
102014
Analysis and benchmarking of graphene based RF low noise amplifiers
H Madan, MJ Hollander, JA Robinson, S Datta
71st Device Research Conference, 41-42, 2013
102013
Extraction of interface state density in oxide/III–V gate stacks
D Veksler, G Bersuker, H Madan, L Morassi, G Verzellesi
Semiconductor Science and Technology 30 (6), 065013, 2015
92015
Extraction of near interface trap density in top gated graphene transistor using high frequency current voltage characteristics
H Madan, MJ Hollander, JA Robinson, S Datta
70th Device Research Conference, 181-182, 2012
82012
Multi-technique study of defect generation in high-k gate stacks
D Veksler, G Bersuker, H Madan, L Vandelli, M Minakais, K Matthews, ...
2012 IEEE International Reliability Physics Symposium (IRPS), 5D. 2.1-5D. 2.5, 2012
82012
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