Sanz JM
Sanz JM
Applied Physics Department Universidad Autónoma de Madrid
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An XPS study of the interaction of oxygen with zirconium
C Morant, JM Sanz, L Galan, L Soriano, F Rueda
Surface Science 218 (2-3), 331-345, 1989
Preferential sputtering of oxides: A comparison of model predictions with experimental data
JB Malherbe, S Hofmann, JM Sanz
Applied surface science 27 (3), 355-365, 1986
Model for quantitative analysis of reflection-electron-energy-loss spectra: Angular dependence
F Yubero, JM Sanz, B Ramskov, S Tougaard
Physical Review B 53 (15), 9719, 1996
An XPS study of the initial stages of oxidation of hafnium
C Morant, L Galan, JM Sanz
Surface and interface Analysis 16 (1‐12), 304-308, 1990
XPS characterization of nitrogen‐doped carbon nanotubes
C Morant, J Andrey, P Prieto, D Mendiola, JM Sanz, E Elizalde
physica status solidi (a) 203 (6), 1069-1075, 2006
Electron inelastic mean free path for Ti, TiC, TiN and TiO2 as determined by quantitative reflection electron energy‐loss spectroscopy
GG Fuentes, E Elizalde, F Yubero, JM Sanz
Surface and Interface Analysis: An International Journal devoted to the …, 2002
Ar-ion bombardment effects on surfaces
C Morant, JM Sanz, L Galan
Physical Review B 45 (3), 1391, 1992
Compositional changes induced by 3.5 keV Ar+ ion bombardment in Ni-Ti oxide systems: A comparative study
AR González-Elipe, G Munuera, JP Espinos, JM Sanz
Surface Science 220 (2-3), 368-380, 1989
Auger electron spectroscopy and X-ray photoelectron spectroscopy studies of the oxidation of polycrystalline tantalum and niobium at room temperature and low oxygen pressures
JM Sanz, S Hofmann
Journal of the Less Common Metals 92 (2), 317-327, 1983
Dielectric loss function of Si and SiO2 from quantitative analysis of REELS spectra
F Yubero, S Tougaard, E Elizalde, JM Sanz
Surface and interface analysis 20 (8), 719-726, 1993
Low energy ion assisted film growth
A Gonzalez-elipe, JM Sanz, F Yubero
World Scientific, 2003
The O 1s x-ray absorption spectra of transition-metal oxides: The TiO2− ZrO2− HfO2 and V2O5− Nb2O5− Ta2O5 series
L Soriano, M Abbate, JC Fuggle, MA Jimenez, JM Sanz, C Mythen, ...
Solid state communications 87 (8), 699-703, 1993
Quantitative evaluation of AES‐depth profiles of thin anodic oxide films (Ta2O5/Ta, Nb2O5/Nb)
JM Sanz, S Hofmann
Surface and interface analysis 5 (5), 210-216, 1983
The statistical sputtering contribution to resolution in concentration-depth profiles
MP Seah, JM Sanz, S Hofmann
Thin Solid Films 81 (3), 239-246, 1981
Chemical changes induced by sputtering in TiO2 and some selected titanates as observed by X-ray absorption spectroscopy
L Soriano, M Abbate, J Vogel, JC Fuggle, A Fernández, ...
Surface science 290 (3), 427-435, 1993
Electronic structure of stoichiometric and -bombarded determined by resonant photoemission
C Morant, A Fernandez, AR Gonzalez-Elipe, L Soriano, A Stampfl, ...
Physical Review B 52 (16), 11711, 1995
Thermal oxidation of TiN studied by means of soft x‐ray absorption spectroscopy
L Soriano, M Abbate, JC Fuggle, P Prieto, C Jiménez, JM Sanz, L Galán, ...
Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films 11 (1 …, 1993
Electronic structure of insulating zirconium nitride
P Prieto, L Galan, JM Sanz
Physical Review B 47 (3), 1613, 1993
Synthesis and characterization of monodisperse magnetite hollow microspheres
M Francisco, C Teresa, C María, P Ramón, R Rolando, F Pedro, ...
Soft Nanoscience Letters 2011, 2011
Dielectric properties of Zr, ZrN, Zr3N4, and ZrO2 determined by quantitative analysis of electron energy loss spectra
P Prieto, F Yubero, E Elizalde, JM Sanz
Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films 14 (6 …, 1996
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