Sanz JM

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Leonardo SorianoProfessor in Applied PhysicsVerified email at uam.es
Pilar Prieto RecioUniversidad Autónoma de MadridVerified email at uam.es
Agustin R. Gonzalez-ElipeResearch Professor of CSIC at the Instituto de Ciencia de Mataeriales de SevillaVerified email at icmse.csic.es
Asuncion FernandezInstituto de Ciencias de Materiales de Sevilla, CSICVerified email at icmse.csic.es
Francisco YuberoTenured scientistVerified email at icmse.csic.es
Miguel AbbateDepartamento de Fisica, Universidade Federal do ParanaVerified email at fisica.ufpr.br
Francisco M Marquez LinaresFull Professor of Chemistry, University of Turabo-Universidad AGM, PR, USAVerified email at uagm.edu
Kleber Roberto PirotaProfessor, Instituto de Física Gleb Wataghin, Universidade Estadual de Campinas (Unicamp)Verified email at ifi.unicamp.br
Sven TougaardProfessor of physics, University of Southern DenmarkVerified email at sdu.dk
Alejandro GutierrezProfessor of Applied Physics, Universidad Autonoma de MadridVerified email at uam.es
G. MunueraUniv Seville - SpainVerified email at us.es
maurizio sacchiCNRS - Institut des NanoSciences de ParisVerified email at synchrotron-soleil.fr
J.F. MarcoInstituto de Química-Física "Rocasolano"Verified email at iqfr.csic.es
Marta ClementUniversidad Politécnica de Madrid. Grupo de Microsistemas y Materiales ElectrónicosVerified email at etsit.upm.es
Jean Michel MartinUniversité de Lyon, Ecole Centrale de LyonVerified email at ec-lyon.fr
JC Sanchez LopezInvestigador Científico CSIC, Instituto de Ciencia de Materiales de Sevilla (CSIC-US)Verified email at icmse.csic.es
Jorge Gómez GarcíaSalesianos AtochaVerified email at salesianosatocha.es
Jan VogelCNRS senior research scientist, Institut Néel, GrenobleVerified email at neel.cnrs.fr
Alfonso CaballeroUniversidad de SevillaVerified email at us.es
Anton P.J. StampflPhysicist, Australian Nuclear Science and Technology OrganisationVerified email at ansto.gov.au

Sanz JM

Applied Physics Department Universidad Autónoma de Madrid

Verified email at uam.es

surface Analysis materials science coatings


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An XPS study of the interaction of oxygen with zirconium C Morant, JM Sanz, L Galan, L Soriano, F Rueda Surface Science 218 (2-3), 331-345, 1989	343	1989
Preferential sputtering of oxides: A comparison of model predictions with experimental data JB Malherbe, S Hofmann, JM Sanz Applied surface science 27 (3), 355-365, 1986	297	1986
Model for quantitative analysis of reflection-electron-energy-loss spectra: Angular dependence F Yubero, JM Sanz, B Ramskov, S Tougaard Physical Review B 53 (15), 9719, 1996	201	1996
An XPS study of the initial stages of oxidation of hafnium C Morant, L Galan, JM Sanz Surface and interface Analysis 16 (1‐12), 304-308, 1990	135	1990
XPS characterization of nitrogen‐doped carbon nanotubes C Morant, J Andrey, P Prieto, D Mendiola, JM Sanz, E Elizalde physica status solidi (a) 203 (6), 1069-1075, 2006	129	2006
Electron inelastic mean free path for Ti, TiC, TiN and TiO₂ as determined by quantitative reflection electron energy‐loss spectroscopy GG Fuentes, E Elizalde, F Yubero, JM Sanz Surface and Interface Analysis: An International Journal devoted to the …, 2002	127	2002
Ar-ion bombardment effects on surfaces C Morant, JM Sanz, L Galan Physical Review B 45 (3), 1391, 1992	105	1992
Compositional changes induced by 3.5 keV Ar+ ion bombardment in Ni-Ti oxide systems: A comparative study AR González-Elipe, G Munuera, JP Espinos, JM Sanz Surface Science 220 (2-3), 368-380, 1989	104	1989
Auger electron spectroscopy and X-ray photoelectron spectroscopy studies of the oxidation of polycrystalline tantalum and niobium at room temperature and low oxygen pressures JM Sanz, S Hofmann Journal of the Less Common Metals 92 (2), 317-327, 1983	98	1983
Dielectric loss function of Si and SiO₂ from quantitative analysis of REELS spectra F Yubero, S Tougaard, E Elizalde, JM Sanz Surface and interface analysis 20 (8), 719-726, 1993	96	1993
Low energy ion assisted film growth A Gonzalez-elipe, JM Sanz, F Yubero World Scientific, 2003	85	2003
The O 1s x-ray absorption spectra of transition-metal oxides: The TiO2− ZrO2− HfO2 and V2O5− Nb2O5− Ta2O5 series L Soriano, M Abbate, JC Fuggle, MA Jimenez, JM Sanz, C Mythen, ... Solid state communications 87 (8), 699-703, 1993	82	1993
Quantitative evaluation of AES‐depth profiles of thin anodic oxide films (Ta₂O₅/Ta, Nb₂O₅/Nb) JM Sanz, S Hofmann Surface and interface analysis 5 (5), 210-216, 1983	79	1983
The statistical sputtering contribution to resolution in concentration-depth profiles MP Seah, JM Sanz, S Hofmann Thin Solid Films 81 (3), 239-246, 1981	79	1981
Chemical changes induced by sputtering in TiO2 and some selected titanates as observed by X-ray absorption spectroscopy L Soriano, M Abbate, J Vogel, JC Fuggle, A Fernández, ... Surface science 290 (3), 427-435, 1993	78	1993
Electronic structure of stoichiometric and -bombarded determined by resonant photoemission C Morant, A Fernandez, AR Gonzalez-Elipe, L Soriano, A Stampfl, ... Physical Review B 52 (16), 11711, 1995	75	1995
Thermal oxidation of TiN studied by means of soft x‐ray absorption spectroscopy L Soriano, M Abbate, JC Fuggle, P Prieto, C Jiménez, JM Sanz, L Galán, ... Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films 11 (1 …, 1993	71	1993
Electronic structure of insulating zirconium nitride P Prieto, L Galan, JM Sanz Physical Review B 47 (3), 1613, 1993	70	1993
Synthesis and characterization of monodisperse magnetite hollow microspheres M Francisco, C Teresa, C María, P Ramón, R Rolando, F Pedro, ... Soft Nanoscience Letters 2011, 2011	64	2011
Dielectric properties of Zr, ZrN, Zr₃N₄, and ZrO₂ determined by quantitative analysis of electron energy loss spectra P Prieto, F Yubero, E Elizalde, JM Sanz Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films 14 (6 …, 1996	64	1996

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