Hotspot detection based on machine learning JAT Robles, SM Fahmy, K Madkour, JY Wuu US Patent 8,402,397, 2013 | 126 | 2013 |
Machine learning-based hotspot detection: Fallacies, pitfalls and marching orders GR Reddy, K Madkour, Y Makris 2019 IEEE/ACM International Conference on Computer-Aided Design (ICCAD), 1-8, 2019 | 30 | 2019 |
Multiple-imaging in 2-D MMI silicon hollow waveguides A Yehia, K Madkour, H Maaty, D Khalil IEEE Photonics Technology Letters 16 (9), 2072-2074, 2004 | 28 | 2004 |
Hotspot detection using machine learning K Madkour, S Mohamed, D Tantawy, M Anis 2016 17th International Symposium on Quality Electronic Design (ISQED), 405-409, 2016 | 26 | 2016 |
Hybrid hotspot detection JAT Robles, SM Fahmy, PLR Beshay, K Madkour, FG Pikus, JY Wuu, ... US Patent 8,504,949, 2013 | 26 | 2013 |
Enhanced OPC recipe coverage and early hotspot detection through automated layout generation and analysis A Hamouda, M Bahnas, D Schumacher, I Graur, A Chen, K Madkour, H Ali, ... Optical Microlithography XXX 10147, 223-231, 2017 | 16 | 2017 |
High coverage of litho hotspot detection by weak pattern scoring J Park, NJ Kim, J Kang, SW Paek, S Kwon, M Shafee, K Madkour, ... Design-Process-Technology Co-optimization for Manufacturability IX 9427, 13-20, 2015 | 16 | 2015 |
Multi-selection method for physical design verification applications S Mostafa, JA Torres, P Rezk, K Madkour Design for Manufacturability through Design-Process Integration V 7974, 32-39, 2011 | 16 | 2011 |
Design space exploration for early identification of yield limiting patterns H Li, E Zou, R Lee, S Hong, S Liu, JY Wang, C Du, R Zhang, K Madkour, ... Design-Process-Technology Co-optimization for Manufacturability X 9781, 285-292, 2016 | 12 | 2016 |
The effect of calibration feature weighting on OPC optical and resist models: investigating the influence on model coefficients and on the overall model fitting A Abdo, R Fathy, K Madkour, J Oberschmidt, D Fischer, M Talbi 25th Annual BACUS Symposium on Photomask Technology 5992, 1470-1477, 2005 | 12 | 2005 |
Silicon hollow waveguide for MEMS applications K Madkour, H Maaty, T Badreldin, B Saadany, D Khalil Proceedings of the European Conference on Optical Communication …, 2003 | 10 | 2003 |
Early stage hot spot analysis through standard cell base random pattern generation JW Jeon, J Song, JL Kim, S Park, SH Yang, S Lee, H Kang, K Madkour, ... Design-Process-Technology Co-optimization for Manufacturability XI 10148 …, 2017 | 9 | 2017 |
A novel algorithm for automatic arrays detection in a layout M Shafee, JW Park, A Aslyan, A Torres, K Madkour, W ElManhawy Design for Manufacturability through Design-Process Integration VII 8684 …, 2013 | 8 | 2013 |
Machine learning to improve accuracy of fast lithographic hotspot detection NJ Kim, KH Park, J Oh, S Jung, S Lee, JH Kang, SW Paek, K Madkour, ... Design-Process-Technology Co-optimization for Manufacturability XIII 10962 …, 2019 | 7 | 2019 |
A random generation approach to pattern library creation for full chip lithographic simulation E Zou, S Hong, L Liu, L Huang, L Yang, A Kabeel, K Madkour, ... Design-Process-Technology Co-optimization for Manufacturability XI 10148 …, 2017 | 6 | 2017 |
Toward automated parasitic extraction of silicon photonics using layout physical verifications M Ismail, RS El Shamy, K Madkour, S Hammouda, MA Swillam Journal of Optics 18 (8), 085801, 2016 | 5 | 2016 |
Layout regularity metric as a fast indicator of high variability circuits E Swillam, K Madkour, M Anis 2013 IEEE International SOC Conference, 43-48, 2013 | 5 | 2013 |
Model based hint for litho hotspot fixing beyond 20nm node JH Kang, BM Kim, N Ha, H bok Choi, K sup Kim, S Mohamed, K Madkour, ... Design for Manufacturability through Design-Process Integration VII 8684 …, 2013 | 5 | 2013 |
Method For Improving Circuit Design Robustness FG Pikus, K Madkour US Patent App. 13/018,204, 2012 | 5 | 2012 |
A weak pattern random creation and scoring method for lithography process tuning M Zhang, G Deng, M Wang, S Yu, X Hu, C Du, Q Wan, Z Liu, G Gao, ... Design-Process-Technology Co-optimization for Manufacturability XII 10588 …, 2018 | 4 | 2018 |