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Agnė Žukauskaitė
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Increased electromechanical coupling in w− ScxAl1− xN
G Wingqvist, F Tasnadi, A Zukauskaite, J Birch, H Arwin, L Hultman
Applied Physics Letters 97 (11), 2010
1842010
Microstructure and dielectric properties of piezoelectric magnetron sputtered w-ScxAl1-xN thin films
A Žukauskaitė, G Wingqvist, J Pališaitis, J Jensen, POÅ Persson, ...
Journal of Applied Physics 111 (9), 093527, 2012
1172012
Wurtzite structure Sc1− xAlxN solid solution films grown by reactive magnetron sputter epitaxy: Structural characterization and first-principles calculations
C Höglund, J Birch, B Alling, J Bareño, Z Czigány, POÅ Persson, ...
Journal of Applied Physics 107 (12), 2010
1162010
Anomalously high thermoelectric power factor in epitaxial ScN thin films
S Kerdsongpanya, N Van Nong, N Pryds, A Žukauskaitė, J Jensen, ...
Applied Physics Letters 99 (23), 2011
1042011
Elastic modulus and coefficient of thermal expansion of piezoelectric Al1− xScxN (up to x= 0.41) thin films
Y Lu, M Reusch, N Kurz, A Ding, T Christoph, M Prescher, L Kirste, ...
APL Materials 6 (7), 2018
100*2018
Experimental determination of the electro-acoustic properties of thin film AlScN using surface acoustic wave resonators
N Kurz, A Ding, DF Urban, Y Lu, L Kirste, NM Feil, A Žukauskaitė, ...
Journal of Applied Physics 126 (7), 2019
822019
Metal‐organic chemical vapor deposition of aluminum scandium nitride
S Leone, J Ligl, C Manz, L Kirste, T Fuchs, H Menner, M Prescher, ...
physica status solidi (RRL)–Rapid Research Letters 14 (1), 1900535, 2020
792020
Surface morphology and microstructure of pulsed DC magnetron sputtered piezoelectric AlN and AlScN thin films
Y Lu, M Reusch, N Kurz, A Ding, T Christoph, L Kirste, V Lebedev, ...
physica status solidi (a) 215 (9), 1700559, 2018
722018
Optical constants and band gap of wurtzite Al1− xScxN/Al2O3 prepared by magnetron sputter epitaxy for scandium concentrations up to x= 0.41
M Baeumler, Y Lu, N Kurz, L Kirste, M Prescher, T Christoph, J Wagner, ...
Journal of Applied Physics 126 (4), 2019
602019
YxAl1―xN thin films
A Zukauskaite, C Tholander, J Palisaitis, POA Persson, V Darakchieva, ...
Journal of physics. D, Applied physics 45 (42), 2012
52*2012
Microstructure and mechanical properties of stress-tailored piezoelectric AlN thin films for electro-acoustic devices
M Reusch, S Cherneva, Y Lu, A Žukauskaitė, L Kirste, K Holc, M Datcheva, ...
Applied Surface Science 407, 307-314, 2017
462017
Wurtzite structure Sc1-xAlxN solid solution films grown by reactive magnetron sputter epitaxy: Structural characterization and first-principles calculations
C Hoglund, J Birch, B Alling, J Bareno, Z Czigany, POA Persson, ...
J. Appl. Phys 107 (123515), 2010
362010
Enhanced electromechanical coupling in SAW resonators based on sputtered non-polar Al0. 77Sc0. 23N 112¯ thin films
A Ding, L Kirste, Y Lu, R Driad, N Kurz, V Lebedev, T Christoph, NM Feil, ...
Applied Physics Letters 116 (10), 2020
352020
Temperature dependence of the pyroelectric coefficient of AlScN thin films
N Kurz, Y Lu, L Kirste, M Reusch, A Žukauskaitė, V Lebedev, O Ambacher
physica status solidi (a) 215 (13), 1700831, 2018
352018
Analysis and optimization of sputter deposited AlN-layers for flexural plate wave devices
M Reusch, K Holc, W Pletschen, L Kirste, A Žukauskaitė, T Yoshikawa, ...
Journal of Vacuum Science & Technology B 34 (5), 2016
322016
Roadmap on energy harvesting materials
V Pecunia, SRP Silva, JD Phillips, E Artegiani, A Romeo, H Shim, J Park, ...
Journal of Physics: Materials 6 (4), 042501, 2023
292023
Stability and residual stresses of sputtered wurtzite AlScN thin films
E Österlund, G Ross, MA Caro, M Paulasto-Kröckel, A Hollmann, M Klaus, ...
Physical Review Materials 5 (3), 035001, 2021
272021
Ab initio calculations and experimental study of piezoelectric YxIn1− xN thin films deposited using reactive magnetron sputter epitaxy
C Tholander, J Birch, F Tasnádi, L Hultman, J Palisaitis, POÅ Persson, ...
Acta Materialia 105, 199-206, 2016
272016
Stabilization of wurtzite Sc0. 4Al0. 6N in pseudomorphic epitaxial ScxAl1− xN/InyAl1− yN superlattices
A Žukauskaitė, C Tholander, F Tasnádi, B Alling, J Palisaitis, J Lu, ...
Acta Materialia 94, 101-110, 2015
232015
Nanoprobe mechanical and piezoelectric characterization of ScxAl1−xN(0001) thin films
A Žukauskaitė, E Broitman, P Sandström, L Hultman, J Birch
physica status solidi (a) 212 (3), 666-673, 2015
222015
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