Agnė Žukauskaitė
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Increased electromechanical coupling in
G Wingqvist, F Tasnadi, A Zukauskaite, J Birch, H Arwin, L Hultman
Applied Physics Letters 97 (11), 112902, 2010
Wurtzite structure solid solution films grown by reactive magnetron sputter epitaxy: Structural characterization and first-principles calculations
C Höglund, J Birch, B Alling, J Bareño, Z Czigány, POÅ Persson, ...
Journal of Applied Physics 107 (12), 123515, 2010
Anomalously high thermoelectric power factor in epitaxial ScN thin films
S Kerdsongpanya, N Van Nong, N Pryds, A Žukauskaitė, J Jensen, ...
Applied Physics Letters 99 (23), 232113, 2011
Microstructure and dielectric properties of piezoelectric magnetron sputtered w-ScxAl1−xN thin films
A Zukauskaite, G Wingqvist, J Palisaitis, J Jensen, POÅ Persson, ...
Journal of Applied Physics 111 (9), 093527, 2012
YxAl1―xN thin films
A Zukauskaite, C Tholander, J Palisaitis, POA Persson, V Darakchieva, ...
Journal of physics. D, Applied physics 45 (42), 2012
Elastic modulus and coefficient of thermal expansion of piezoelectric Al1−xScxN (up to x = 0.41) thin films
Y Lu, M Reusch, N Kurz, A Ding, T Christoph, M Prescher, L Kirste, ...
APL Materials 6 (7), 076105, 2018
Surface morphology and microstructure of pulsed DC magnetron sputtered piezoelectric AlN and AlScN thin films
Y Lu, M Reusch, N Kurz, A Ding, T Christoph, L Kirste, V Lebedev, ...
physica status solidi (a) 215 (9), 1700559, 2018
Microstructure and mechanical properties of stress-tailored piezoelectric AlN thin films for electro-acoustic devices
M Reusch, S Cherneva, Y Lu, A Žukauskaitė, L Kirste, K Holc, M Datcheva, ...
Applied Surface Science 407, 307-314, 2017
Analysis and optimization of sputter deposited AlN-layers for flexural plate wave devices
M Reusch, K Holc, W Pletschen, L Kirste, A Žukauskaitė, T Yoshikawa, ...
Journal of Vacuum Science & Technology B, Nanotechnology and …, 2016
Nanoprobe mechanical and piezoelectric characterization of ScxAl1-xN (0001) thin films
A Zukauskaite, E Broitman, P Sandström, L Hultman, J Birch
Physica Status Solidi (a) applications and materials science 212 (3), 666-673, 2015
Microstructure and Dielectric Properties of Piezoelectric Magnetron Sputtered w-ScxAl1-xN thin films
A Žukauskaitė, G Wingqvist, J Pališaitis, J Jensen, POÅ Persson, ...
Journal of Applied Physics 111 (9), 093527, 2012
Stabilization of wurtzite Sc0. 4Al0. 6N in pseudomorphic epitaxial ScxAl1− xN/InyAl1− yN superlattices
A Žukauskaitė, C Tholander, F Tasnádi, B Alling, J Palisaitis, J Lu, ...
Acta Materialia 94, 101-110, 2015
Bandgap engineering and optical constants of YxAl1-xN alloys
NB Sedrine, A Zukauskaite, J Birch, L Hultman, V Darakchieva
Japanese Journal of Applied Physics 52 (8S), 08JM02, 2013
YxAl1− xN thin films
A Žukauskaitė, C Tholander, J Palisaitis, POÅ Persson, V Darakchieva, ...
Journal of Physics D: Applied Physics 45 (42), 422001, 2012
Experimental determination of the electro-acoustic properties of thin film AlScN using surface acoustic wave resonators
N Kurz, A Ding, DF Urban, Y Lu, L Kirste, NM Feil, A Žukauskaitė, ...
Journal of Applied Physics 126 (7), 075106, 2019
Ab initio calculations and experimental study of piezoelectric YxIn1− xN thin films deposited using reactive magnetron sputter epitaxy
C Tholander, J Birch, F Tasnádi, L Hultman, J Palisaitis, POÅ Persson, ...
Acta Materialia 105, 199-206, 2016
Temperature Dependence of the Pyroelectric Coefficient of AlScN Thin Films
N Kurz, Y Lu, L Kirste, M Reusch, A Žukauskaitė, V Lebedev, O Ambacher
physica status solidi (a) 215 (13), 1700831, 2018
Optical constants and band gap of wurtzite Al1−xScxN/Al2O3 prepared by magnetron sputter epitaxy for scandium concentrations up to x = 0.41
M Baeumler, Y Lu, N Kurz, L Kirste, M Prescher, T Christoph, J Wagner, ...
Journal of Applied Physics 126 (4), 045715, 2019
Piezoelectric characterization of Sc0. 26Al0. 74N layers on Si (001) substrates
MS Lozano, A Pérez-Campos, M Reusch, L Kirste, T Fuchs, ...
Materials Research Express 5 (3), 036407, 2018
Enhanced actuation of nanocrystalline diamond microelectromechanical disk resonators with AlN layers
T Yoshikawa, M Reusch, K Holc, D Iankov, V Zuerbig, A Zukauskaite, ...
Applied Physics Letters 108 (17), 171903, 2016
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