| A Beacon-based docking system for an autonomous mobile robot KV Raj, K Patil, DVK Kariappa, AM Jakati National Conference on Mechanisms and Machines (NaCoMM07), India, 1-7, 2007 | 12 | 2007 |
| Fault Isolation of DQ Failures in 14 nm SRAM Using Laser Voltage Imaging and Probing KA Serrels, A Kalarikkal, AM Jakati, G Dabney ISTFA 2016, 564-567, 2016 | 2 | 2016 |
| Combining Volume Scan Diagnosis and Dynamic FA for Precise Isolation of Manufacturing Defects PB A.M. Jakati, Rohan Deshpande, Dr Keith A Serrels, Gregory Dabney, Anoop ... ISTFA 2017, 2017 | 1* | 2017 |
| Advanced Wafer Level Non-destructive Fault Isolation (FI) and Challenges A Jakati VLSI Test Symposium 2019, 2019 | | 2019 |
| Fault Isolation of DQ Failures in 14nm SRAM using Laser Voltage Imaging and Probing AK AM Jakati, Dr Keith A Serrels, Gregory Dabney ISTFA 2016: Proceedings from the 42nd International Symposium for Testing …, 2016 | | 2016 |
| Characterization of 14 nm Silicon Integrated Circuits with 1.55–2 μm Emission Microscopy—A Case Study KA Serrels, A Kalarikkal, AM Jakati, C Schmidt, G Dabney ISTFA 2016, 258-267, 2016 | | 2016 |
Varun Raj KompellaSony AIVerified email at sony.com
Varun Raj KompellaSony AIVerified email at sony.com