| Nanoscale measurement of the dielectric constant of supported lipid bilayers in aqueous solutions with electrostatic force microscopy G Gramse, A Dols-Pérez, MA Edwards, L Fumagalli, G Gomila Biophysical journal 104 (6), 1257-1262, 2013 | 207 | 2013 |
| Calibrated complex impedance and permittivity measurements with scanning microwave microscopy G Gramse, M Kasper, L Fumagalli, G Gomila, P Hinterdorfer, F Kienberger Nanotechnology 25 (14), 145703, 2014 | 156 | 2014 |
| Quantifying the dielectric constant of thick insulators using electrostatic force microscopy L Fumagalli, G Gramse, D Esteban-Ferrer, MA Edwards, G Gomila Applied Physics Letters 96 (18), 2010 | 116 | 2010 |
| Quantitative dielectric constant measurement of thin films by DC electrostatic force microscopy G Gramse, I Casuso, J Toset, L Fumagalli, G Gomila Nanotechnology 20 (39), 395702, 2009 | 95 | 2009 |
| Nanoscale electric permittivity of single bacterial cells at gigahertz frequencies by scanning microwave microscopy MC Biagi, R Fabregas, G Gramse, M Van Der Hofstadt, A Juarez, ... ACS nano 10 (1), 280-288, 2016 | 91 | 2016 |
| Quantifying the dielectric constant of thick insulators by electrostatic force microscopy: effects of the microscopic parts of the probe G Gramse, G Gomila, L Fumagalli Nanotechnology 23 (20), 205703, 2012 | 80 | 2012 |
| Finite-size effects and analytical modeling of electrostatic force microscopy applied to dielectric films G Gomila, G Gramse, L Fumagalli Nanotechnology 25 (25), 255702, 2014 | 70 | 2014 |
| Nondestructive imaging of atomically thin nanostructures buried in silicon G Gramse, A Kölker, T Lim, TJZ Stock, H Solanki, SR Schofield, ... Science advances 3 (6), e1602586, 2017 | 69 | 2017 |
| Probing resistivity and doping concentration of semiconductors at the nanoscale using scanning microwave microscopy E Brinciotti, G Gramse, S Hommel, T Schweinboeck, A Altes, MA Fenner, ... Nanoscale 7 (35), 14715-14722, 2015 | 65 | 2015 |
| Quantitative sub-surface and non-contact imaging using scanning microwave microscopy G Gramse, E Brinciotti, A Lucibello, SB Patil, M Kasper, C Rankl, ... Nanotechnology 26 (13), 135701, 2015 | 54 | 2015 |
| Calibrated complex impedance of CHO cells and E. coli bacteria at GHz frequencies using scanning microwave microscopy SS Tuca, G Badino, G Gramse, E Brinciotti, M Kasper, YJ Oh, R Zhu, ... Nanotechnology 27 (13), 135702, 2016 | 51 | 2016 |
| Dynamic electrostatic force microscopy in liquid media G Gramse, MA Edwards, L Fumagalli, G Gomila Applied Physics Letters 101 (21), 2012 | 47 | 2012 |
| Nanoscale electric polarizability of ultrathin biolayers on insulating substrates by electrostatic force microscopy A Dols-Perez, G Gramse, A Calò, G Gomila, L Fumagalli Nanoscale 7 (43), 18327-18336, 2015 | 41 | 2015 |
| Measuring low loss dielectric substrates with scanning probe microscopes J Hoffmann, G Gramse, J Niegemann, M Zeier, F Kienberger Applied Physics Letters 105 (1), 2014 | 37 | 2014 |
| Nanoscale imaging of mobile carriers and trapped charges in delta doped silicon p–n junctions G Gramse, A Kölker, T Škereň, TJZ Stock, G Aeppli, F Kienberger, ... Nature Electronics 3 (9), 531-538, 2020 | 32 | 2020 |
| Theory of amplitude modulated electrostatic force microscopy for dielectric measurements in liquids at MHz frequencies G Gramse, MA Edwards, L Fumagalli, G Gomila Nanotechnology 24 (41), 415709, 2013 | 30 | 2013 |
| Assessment of lithium ion battery ageing by combined impedance spectroscopy, functional microscopy and finite element modelling NAZ R-Smith, M Leitner, I Alic, D Toth, M Kasper, M Romio, Y Surace, ... Journal of Power Sources 512, 230459, 2021 | 26 | 2021 |
| Nanoscale charge accumulation and its effect on carrier dynamics in tri-cation perovskite structures D Toth, B Hailegnaw, F Richheimer, FA Castro, F Kienberger, ... ACS Applied Materials & Interfaces 12 (42), 48057-48066, 2020 | 26 | 2020 |
| Metal-oxide-semiconductor capacitors and Schottky diodes studied with scanning microwave microscopy at 18 GHz M Kasper, G Gramse, J Hoffmann, C Gaquiere, R Feger, A Stelzer, ... Journal of Applied Physics 116 (18), 2014 | 23 | 2014 |
| Three-dimensional finite-element simulations of a scanning microwave microscope cantilever for imaging at the nanoscale AO Oladipo, M Kasper, S Lavdas, G Gramse, F Kienberger, NC Panoiu Applied Physics Letters 103 (21), 2013 | 23 | 2013 |
