| Crystalline properties and strain relaxation mechanism of CVD grown GeSn F Gencarelli, B Vincent, J Demeulemeester, A Vantomme, A Moussa, ... ECS Journal of Solid State Science and Technology 2 (4), P134, 2013 | 155 | 2013 |
| Three-dimensional doping and diffusion in nano scaled devices as studied by atom probe tomography AK Kambham, A Kumar, A Florakis, W Vandervorst Nanotechnology 24 (27), 275705, 2013 | 45 | 2013 |
| Ge1-xSnx Materials: Challenges and Applications R Loo, B Vincent, F Gencarelli, C Merckling, A Kumar, G Eneman, ... ECS Transactions 50 (9), 853, 2013 | 42 | 2013 |
| Ge1-xSnx materials: Challenges and applications R Loo, B Vincent, F Gencarelli, C Merckling, A Kumar, G Eneman, ... ECS Journal of Solid State Science and Technology 2 (1), N35, 2012 | 42 | 2012 |
| Atom probe tomography analysis of SiGe fins embedded in SiO2: Facts and artefacts D Melkonyan, C Fleischmann, L Arnoldi, J Demeulemeester, A Kumar, ... Ultramicroscopy 179, 100-107, 2017 | 26 | 2017 |
| 3D site specific sample preparation and analysis of 3D devices (FinFETs) by atom probe tomography AK Kambham, A Kumar, M Gilbert, W Vandervorst Ultramicroscopy 132, 65-69, 2013 | 18 | 2013 |
| Laser-assisted atom probe tomography of semiconductors: The impact of the focused-ion beam specimen preparation J Bogdanowicz, A Kumar, C Fleischmann, M Gilbert, J Houard, A Vella, ... Ultramicroscopy 188, 19-23, 2018 | 16 | 2018 |
| On the interplay between relaxation, defect formation, and atomic Sn distribution in Ge (1− x) Sn (x) unraveled with atom probe tomography A Kumar, J Demeulemeester, J Bogdanowicz, J Bran, D Melkonyan, ... Journal of Applied Physics 118 (2), 025302, 2015 | 15 | 2015 |
| Amorphous inclusions during Ge and GeSn epitaxial growth via chemical vapor deposition F Gencarelli, Y Shimura, A Kumar, B Vincent, A Moussa, D Vanhaeren, ... Thin Solid Films 590, 163-169, 2015 | 14 | 2015 |
| Atomic insight into Ge 1− x Sn x using atom probe tomography A Kumar, MP Komalan, H Lenka, AK Kambham, M Gilbert, F Gencarelli, ... Ultramicroscopy 132, 171-178, 2013 | 11 | 2013 |
| Atomic insight into Ge {sub 1− x} Sn {sub x} using atom probe tomography A Kumar, KU IKS, MP Komalan, H Lenka, AK Kambham, KU IKS, ... | 11* | 2013 |
| Atomic insight into Ge1− xSnx using atom probe tomography A Kumar, MP Komalan, H Lenka, AK Kambham, M Gilbert, F Gencarelli, ... Ultramicroscopy 132, 171-178, 2013 | 11 | 2013 |
| Atom probe tomography for 3D-dopant analysis in FinFET devices AK Kambham, G Zschaetzsch, Y Sasaki, M Togo, N Horiguchi, J Mody, ... 2012 Symposium on VLSI Technology (VLSIT), 77-78, 2012 | 9 | 2012 |
| Measurement of the apex temperature of a nanoscale semiconducting field emitter illuminated by a femtosecond pulsed laser A Kumar, J Bogdanowicz, J Demeulemeester, J Bran, D Melkonyan, ... Journal of Applied Physics 124 (24), 245105, 2018 | 8 | 2018 |
| On the nucleation of PdSi and NiSi2 during the ternary Ni (Pd)/Si (100) reaction A Schrauwen, J Demeulemeester, A Kumar, W Vandervorst, CM Comrie, ... Journal of Applied Physics 114 (6), 063518, 2013 | 6 | 2013 |
| Progress in i-Module: Towards improved performance, reliability and module-level fabrication technologies for back-contact PV modules based on ultra-thin silicon solar cells J Govaerts, R Labie, SN Granata, M Gonzalez, B O'Sullivan, ... 26th European Photovoltaic Solar Energy Conference and Exhibition-EU PVSEC …, 2011 | 6 | 2011 |
| Qualitative and Quantitative analysis of compound semiconductors using Atom Probe Tomogaphy A Kumar | 3 | 2016 |
| Method for heterojunction interface passivation A Kumar, T Bearda, A Gougam US Patent WO/2012/08 515, 529, 2012 | 2 | 2012 |
| Emitter shape evolution during field evaporation and its impact on the reconstructed data of SiGe fins embedded in SiO2 D Melkonyan, L Arnoldi, C Fleischmann, A Kumar, F Vurpillot, ... APT&M, Date: 2016/01/01-2016/01/06, Location: Gyeongju Korea, 2016 | 1 | 2016 |
| Study of Sn migration during relaxation of Ge {sub 1-x} Sn {sub x} layers using atom probe tomography A Kumar, F Gencarelli, AK Kambham, W Vandervorst, KU IKS, M Gilbert, ... | 1* | 2012 |
Federica GencarelliSenior Engineering Project ManagerПотвърден имейл адрес: lumentum.com
