Andrea Scorzoni
Andrea Scorzoni
Associate professor of Electronics, University of Perugia, Italy
Verified email at unipg.it
Title
Cited by
Cited by
Year
Electromigration in thin-film interconnection lines: models, methods and results
A Scorzoni, B Neri, C Caprile, F Fantini
Materials Science Reports 7 (4-5), 143-220, 1991
1731991
Flexible tag microlab development: gas sensors integration in RFID flexible tags for food logistic
E Abad, S Zampolli, S Marco, A Scorzoni, B Mazzolai, A Juarros, ...
Sensors and Actuators B: Chemical 127 (1), 2-7, 2007
1722007
Layered distribution of charge carriers in organic thin film transistors
A Shehu, SD Quiroga, P D’Angelo, C Albonetti, F Borgatti, M Murgia, ...
Physical review letters 104 (24), 246602, 2010
1372010
Thermal characterization of a microheater for micromachined gas sensors
M Baroncini, P Placidi, GC Cardinali, A Scorzoni
Sensors and Actuators A: Physical 115 (1), 8-14, 2004
1042004
An RFID reader with onboard sensing capability for monitoring fruit quality
A Vergara, E Llobet, JL Ramírez, P Ivanov, L Fonseca, S Zampolli, ...
Sensors and Actuators B: Chemical 127 (1), 143-149, 2007
982007
Automated defect detection in uniform and structured fabrics using Gabor filters and PCA
L Bissi, G Baruffa, P Placidi, E Ricci, A Scorzoni, P Valigi
Journal of Visual Communication and Image Representation 24 (7), 838-845, 2013
842013
Radiation-hard semiconductor detectors for SuperLHC
M Bruzzi, J Adey, A Al-Ajili, P Alexandrov, G Alfieri, PP Allport, ...
Nuclear Instruments and Methods in Physics Research Section A: Accelerators …, 2005
632005
Metal/semiconductor contact resistivity and its determination from contact resistance measurements
A Scorzoni, M Finetti
Materials Science Reports 3 (2), 79-137, 1988
631988
Development of radiation tolerant semiconductor detectors for the Super-LHC
M Moll, J Adey, A Al-Ajili, G Alfieri, PP Allport, M Artuso, S Assouak, ...
Nuclear Instruments and Methods in Physics Research Section A: Accelerators …, 2005
622005
Lateral current crowding effects on contact resistance measurements in four terminal resistor test patterns
M Finetti, A Scorzoni, G Soncini
IEEE electron device letters 5 (12), 524-526, 1984
621984
Ultra-low-power components for an RFID Tag with physical and chemical sensors
S Zampolli, I Elmi, E Cozzani, GC Cardinali, A Scorzoni, M Cicioni, ...
Microsystem technologies 14 (4-5), 581-588, 2008
592008
Radiation hardness after very high neutron irradiation of minimum ionizing particle detectors based on 4H-SiC p/sup+/n junctions
F Moscatelli, A Scorzoni, A Poggi, M Bruzzi, S Sciortino, S Lagomarsino, ...
IEEE transactions on nuclear science 53 (3), 1557-1563, 2006
582006
Environmental monitoring system compliant with the IEEE 1451 standard and featuring a simplified transducer interface
L Bissi, P Placidi, A Scorzoni, I Elmi, S Zampolli
Sensors and Actuators A: Physical 137 (1), 175-184, 2007
482007
Electromigration testing of integrated circuit interconnections
F Fantini, JR Lloyd, I De Munari, A Scorzoni
Microelectronic engineering 40 (3-4), 207-221, 1998
481998
Recent advancements in the development of radiation hard semiconductor detectors for S-LHC
E Fretwurst, J Adey, A Al-Ajili, G Alfieri, PP Allport, M Artuso, S Assouak, ...
Nuclear Instruments and Methods in Physics Research Section A: Accelerators …, 2005
462005
Ion‐implanted, electron‐beam annealed TiN films as diffusion barriers for Al on Si shallow junctions
A Armigliato, M Finetti, J Garrido, S Guerri, P Ostoja, A Scorzoni
Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films 3 (6 …, 1985
381985
Electromigration in thin-films for microelectronics
GL Baldini, I De Munari, A Scorzoni, F Fantini
Microelectronics Reliability 33 (11-12), 1779-1805, 1993
361993
Improved electrical characterization of Al–Ti ohmic contacts on p-type ion implanted 6H-SiC
F Moscatelli, A Scorzoni, A Poggi, GC Cardinali, R Nipoti
Semiconductor science and technology 18 (6), 554, 2003
352003
Current crowding and misalignment effects as sources of error in contact resistivity measurements—Part I: Computer simulation of conventional CER and CKR structures
A Scorzoni, M Finetti, K Grahn, I Suni, P Cappelletti
IEEE transactions on electron devices 34 (3), 525-531, 1987
341987
Biased resistor network model for electromigration failure and related phenomena in metallic lines
C Pennetta, E Alfinito, L Reggiani, F Fantini, I DeMunari, A Scorzoni
Physical Review B 70 (17), 174305, 2004
332004
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